Electrical characteristics of Si single-electron transistor based on multiple islands

被引:1
|
作者
Ohkura, Kensaku [1 ]
Kitade, Tetsuya [1 ]
Nakajima, Anri [1 ]
机构
[1] Hiroshima Univ, Res Ctr Nanodevices & Syst, Hiroshima 739, Japan
关键词
single electron transistor; multiple islands; cotunneling; inelastic cotunneling; elastic cotunneling; Si; negative differential conductance;
D O I
10.1143/JJAP.46.6233
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated the electrical characteristics specifically associated with cotunneling and quantum effects of single-electron transistors (SETs) with three geometrically defined islands. Clear Coulomb oscillation and negative differential conductance were observed. The drain current for the peaks and valleys of the Coulomb oscillation was measured as a function of temperature and drain voltage. Consequently, it was found that the valley current was well described by the inelastic cotunneling theory at temperatures above 40 K in the low-drain-voltage region; on the other hand, elastic cotunneling dominantly contributed to the valley current in the low-temperature and low-drain-voltage region. However, for a high gate voltage, the SET behaved as a single-island device. This is probably because the three islands were electrically enlarged and merged into a single island owing to the high applied gate voltage.
引用
收藏
页码:6233 / 6236
页数:4
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