The temperature dependence of electron transport in a composite film of graphene oxide with single-wall carbon nanotubes: an analysis and comparison with a nanotube film
The work describes the results of low-temperature studies (5-291 K) of electron transport in composite films of graphene oxide with single-wall nanotubes (GO-SWNTs) obtained by vacuum filtration of their aqueous suspension. The emergence of conductivity in such films is shown to be related to nanotubes, since the GO film, unlike the nanotube film, has no conductivity. For a comparative analysis, the electrical conductivity of the SWNT film was also considered. The GO-SWNT and SWNT films exhibit a semiconductor behavior with a negative temperature coefficient of electrical conductivity. The temperature dependences of film resistance have been analyzed using the 3D Mott model that describes the motion of electrons (due to thermally activated tunneling through barriers) with variable-range hopping (the VRH model) in an interval of 5-240 K. The analysis of the dependences yielded estimates for the parameters of electron transport in the composite GO-SWNT film and SWNT nanotube film: the average hopping range and energy of the electron; their temperature dependences have been plotted. A comparison of these parameters for different films showed that nanotube contact with the GO surface hinders electron transport in the composite film. To describe the temperature dependence of film resistance at. > 240 K, the Arrhenius model is used from which the potential barrier value has been obtained. Published under license by AIP Publishing.
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Luan, Jian
Hou, Peng-Xiang
论文数: 0|引用数: 0|
h-index: 0|
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Hou, Peng-Xiang
Liu, Chang
论文数: 0|引用数: 0|
h-index: 0|
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Liu, Chang
Shi, Chao
论文数: 0|引用数: 0|
h-index: 0|
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Shi, Chao
Li, Guo-Xian
论文数: 0|引用数: 0|
h-index: 0|
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
Li, Guo-Xian
Cheng, Hui-Ming
论文数: 0|引用数: 0|
h-index: 0|
机构:
Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R ChinaChinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
机构:
Japan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Matsuoka, Yukitaka
Fujiwara, Akihiko
论文数: 0|引用数: 0|
h-index: 0|
机构:
Japan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Japan Sci & Technology Corp, CREST, Kawaguchi, Saitama 3320012, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Fujiwara, Akihiko
Ogawa, Naoki
论文数: 0|引用数: 0|
h-index: 0|
机构:
Univ Tokyo, Sch Engn, Dept Appl Phys, Bunkyo Ku, Tokyo 1138656, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Ogawa, Naoki
Miyano, Kenjiro
论文数: 0|引用数: 0|
h-index: 0|
机构:
Univ Tokyo, Res Ctr Adv Sci & Technol, Meguro Ku, Tokyo 1538904, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Miyano, Kenjiro
论文数: |引用数: |
h-index: |
机构:
Kataura, Hiromichi
Maniwa, Yutaka
论文数: 0|引用数: 0|
h-index: 0|
机构:
Japan Sci & Technology Corp, CREST, Kawaguchi, Saitama 3320012, Japan
Tokyo Metropolitan Univ, Sch Sci, Dept Phys, Hachioji, Tokyo 1920397, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Maniwa, Yutaka
Suzuki, Shinzo
论文数: 0|引用数: 0|
h-index: 0|
机构:
Tokyo Metropolitan Univ, Sch Sci, Dept Chem, Hachioji, Tokyo 1920397, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
Suzuki, Shinzo
Achiba, Yohji
论文数: 0|引用数: 0|
h-index: 0|
机构:
Tokyo Metropolitan Univ, Sch Sci, Dept Chem, Hachioji, Tokyo 1920397, JapanJapan Adv Inst Sci & Technol, Sch Mat Sci, 1-1 Asahidai, Tatsunokuchi, Ishikawa 9231292, Japan
机构:
Korea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Lee, Jae-Kap
Lee, Sohyung
论文数: 0|引用数: 0|
h-index: 0|
机构:
Korea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Dongguk Univ, Dept Semicond Sci, Seoul 100715, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Lee, Sohyung
Kim, Jin-Gyu
论文数: 0|引用数: 0|
h-index: 0|
机构:
Korea Basic Sci Inst, Div Electron Microscop Res, Taejon 305333, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Kim, Jin-Gyu
Min, Bong-Ki
论文数: 0|引用数: 0|
h-index: 0|
机构:
Yeungnam Univ, Instrumental Anal Ctr, Taegu 712749, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Min, Bong-Ki
Kim, Yong-Il
论文数: 0|引用数: 0|
h-index: 0|
机构:
Korea Res Inst Stand & Sci, Taejon 305600, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Kim, Yong-Il
Lee, Kyung-Il
论文数: 0|引用数: 0|
h-index: 0|
机构:
Korea Inst Sci & Technol, Ctr Spintron Res, Seoul 130650, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea
Lee, Kyung-Il
An, Kay Hyeok
论文数: 0|引用数: 0|
h-index: 0|
机构:
Jeonju Machinery Res Ctr, Nano Mat Res Dept, Jeonju 561844, South KoreaKorea Inst Sci & Technol, Interface Control Res Ctr, Seoul 130650, South Korea