Excitonic transitions in β-FeSi2 epitaxial films and single crystals

被引:11
|
作者
Birdwell, AG [1 ]
Shaffner, TJ
Chandler-Horowitz, D
Buh, GH
Rebien, M
Henrion, W
Stauss, P
Behr, G
Malikova, L
Pollak, FH
Littler, CL
Glosser, R
Collins, S
机构
[1] NIST, Div Semicond Elect, Gaithersburg, MD 20899 USA
[2] Hahn Meitner Inst Berlin GmbH, Abt Photovoltaik, D-12489 Berlin, Germany
[3] Inst Solid State & Mat Res Dresden, D-01171 Dresden, Germany
[4] CUNY Brooklyn Coll, Dept Phys, Brooklyn, NY 11210 USA
[5] CUNY Brooklyn Coll, New york State Ctr Adv Technol Ultrafast Photon M, Brooklyn, NY 11210 USA
[6] Univ N Texas, Dept Phys, Denton, TX 76203 USA
[7] Univ Texas, Dept Phys, Richardson, TX 75080 USA
关键词
D O I
10.1063/1.1643778
中图分类号
O59 [应用物理学];
学科分类号
摘要
Photoreflectance spectra were obtained from an epitaxial film and a bulk single crystal of beta-FeSi2 at low temperatures (Tless than or equal to180 K). A model based on the results of low-temperature absorption [M. Rebien , Appl. Phys. Lett. 74, 970 (1999)] was used to describe the main features of the spectra. In agreement with the absorption results, transitions corresponding to the ground state and first excited state of the free exciton were observed in both the epitaxial film and single crystal. However, additional subband gap features are revealed in the photoreflectance spectra of the thin film. It is suggested that these may be related to impurity transitions or an impurity transition plus a bound exciton resonance. From the analysis of the spectra taken on the thin film, over a temperature range of 12-180 K, we extract a free exciton binding energy of (0.009+/-0.002) eV and a direct energy gap at T=0 K of (0.934+/-0.002) eV. (C) 2004 American Institute of Physics.
引用
收藏
页码:2441 / 2447
页数:7
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