Evidence for highly correlated electron dynamics in two-photon double ionization of helium

被引:55
|
作者
Foumouo, E. [1 ]
Antoine, Ph [1 ]
Piraux, B. [1 ]
Malegat, L. [2 ]
Bachau, H. [3 ]
Shakeshaft, R. [4 ]
机构
[1] Catholic Univ Louvain, Lab Phys Atom Mol & Opt Unite PAMO, B-1348 Louvain, Belgium
[2] Univ Paris 11, UMR 8624 CNRS, LIXAM, F-91405 Orsay, France
[3] Univ Bordeaux 1, CNRS, CEA, UMR 5107,CELIA, F-33405 Talence, France
[4] Univ So Calif, Dept Phys, Los Angeles, CA 90089 USA
关键词
D O I
10.1088/0953-4075/41/5/051001
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Experiments using new sources of XUV pulses now tackle the difficult problem of few- photon direct double ionization of atoms. Despite its apparent simplicity, the fundamental process of two- photon direct double ionization of helium is far from being understood. Here, we use a time- dependent approach to study the process. Our results for the electron angular and energy distributions demonstrate that the dominant mechanism for double- electron escape involves a highly correlated electron motion. Angular correlations strongly favour back- to- back electron emission along the polarization axis, while dynamical screening leads to an equipartition of the electron energy for a broad range of field frequencies. These features are reflected in the recoil- ion- momentum distributions that are presently accessible to experiments.
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页数:9
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