A 24 GHz Low-Noise Amplifier Using RF Junction Varactors for Noise Optimization and CDM ESD Protection in 90 nm CMOS

被引:9
|
作者
Tsai, Ming-Hsien [1 ]
Hsu, Shawn S. H.
机构
[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu 300, Taiwan
关键词
Charge device model (CDM); electrostatic discharge (ESD); low-noise amplifier (LNA); transmission line pulse (TLP); very fast transmission line pulse (VFTLP);
D O I
10.1109/LMWC.2011.2152387
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This letter presents an ESD-protected 24 GHz low-noise amplifier (LNA) in 90 nm CMOS using RF junction varactors for noise optimization and ESD protection simultaneously. One of the junction varactors, inserted as an extra gate-source capacitance, provides an effective CDM ESD protection, and is also used for power-constrained simultaneous noise and input matching. The measured results demonstrate a 2.7 A (corresponding to a 4 kV HBM) and an 11.4 A ESD protection levels using transmission line pulse and very fast transmission line pulse tests, respectively. Under a power consumption of 9.1 mW, the ESD-protected LNA presents a NF of 2.9 dB and power gain of 15.2 dB at the center frequency of 24 GHz.
引用
收藏
页码:374 / 376
页数:3
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