3D profile measurement by color pattern projection and system calibration

被引:0
|
作者
Sinlapeecheewa, C [1 ]
Takamasu, K [1 ]
机构
[1] Univ Tokyo, Dept Precis Engn, Bunkyo Ku, Tokyo, Japan
关键词
3D profile measurement; structured light; color pattern projection; projector-cameras calibration;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we present a new color structured lighting for 3D profile measurement by projecting a pattern of color stripes. The advantage of using color pattern is that it simplifies the difficult matching problem of using a multiple-line stripe pattern. The problem of finding the correct color stripe correspondence between light source and images is solved by accurately calibrating the system parameters. A technique for camera-projector calibration using calibration points that projected from projector is presented. The mean error of this calibration method is about 0.2 mm. A pattern of color stripes is projected onto the objects when taking images with cameras from various viewpoints, stripe pattern information are extracted from the acquired images and then used for finding the correct projected-observed stripe match. After matched stripes information was obtained, 3D profile is reconstructed by means of triangulation. The selection of color used to generate the color-stripe pattern is presented. An experiment using human hand as a model is also demonstrated.
引用
收藏
页码:405 / 410
页数:6
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