Morphology of thin lead films grown on glass substrates by atomic force and electron microscopy

被引：2
|
作者：
Bhaumik, S
Kundu, S
SenGupta, SP [1 ]
机构：
[1] Indian Assoc Cultivat Sci, Dept Mat Sci, Kolkata 700032, W Bengal, India
[2] Saha Inst Nucl Phys, Surface Phys Div, Kolkata 700064, W Bengal, India
来源：
MATERIALS CHEMISTRY AND PHYSICS | 2001年 / 72卷 / 01期
关键词：
lead film; vacuum evaporation; AFM; TEM;
D O I：
10.1016/S0254-0584(01)00294-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The morphology of vacuum evaporated lead films (similar to 50-200 Angstrom) on glass substrates has been investigated by atomic force microscopy and transmission electron microscopy with selected area diffraction. It is observed that the grain size increases with film thickness. When the thickness exceeds a certain value, the grains coalesce to form clusters. The size and roughness have been investigated by atomic force microscopy. The selected area diffraction pattern show polycrystalline nature of the films even at 60 Angstrom thickness. The transmission electron microscopy shows isolated grains at lower thickness which agglomerate at higher thickness. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：16 / 22
页数：7
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