On the use of atomic force microscopy for structural mapping of metallic-glass thin films

被引：22
|
作者：
Zeng, J. F. [1 ]
Chu, J. P. [2 ]
Chen, Y. C. [2 ,3 ]
Volland, A. [4 ]
Blandin, J. J. [4 ]
Gravier, S. [4 ]
Yang, Y. [1 ]
机构：
[1] City Univ Hong Kong, Dept Mech & Biomed Engn, Ctr Adv Struct Mat, Tat Chee Ave, Kowloon, Hong Kong, Peoples R China
[2] Natl Taiwan Univ Sci & Technol, Dept Mat Sci & Engn, Taipei 106, Taiwan
[3] Inst Nucl Energy Res, Nucl Fuels & Mat Div, Tao Yuan 321, Taiwan
[4] Univ Grenoble, CNRS, SIMAP Lab, UJF,Grenoble INP, F-38402 St Martin Dheres, France
来源：
INTERMETALLICS | 2014年 / 44卷
关键词：
Glasses; metallic; Internal friction; Surface properties; Scanning tunneling electron microscopy; including atomic force microscopy;
D O I：
10.1016/j.intermet.2013.09.006
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码：121 / 127
页数：7
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