Deep-submicron noise

被引：0

作者：

MacDonald, JF ^{[1
]}

McBride, J

Nagaraj, NS

Zhang, XN

Shepard, KL

机构：

[1] Sun Microelect, Palo Alto, CA USA

[2] Hewlett Packards Engn Syst Lab, Ft Collins, CO USA

[3] Texas Instruments Inc, Dallas, TX USA

[4] Columbia Univ, New York, NY USA

[5] Metaflow Technol, La Jolla, CA USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1998年 / 15卷 / 04期

关键词：

D O I：

10.1109/MDT.1998.735931

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

页码：82 / 88

页数：7

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