A small granular controlled leakage reduction system for SRAMs

被引:8
|
作者
Geens, P [1 ]
Dehaene, W [1 ]
机构
[1] Katholieke Univ Leuven, ESAT, MICAS, B-3001 Heverlee, Belgium
关键词
leakage reduction; SRAM; small granular control; dynamic voltage control;
D O I
10.1016/j.sse.2005.10.020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In current and future technologies, the leakage of the transistors is a major contributor to the total power dissipation. That effect is even reinforced in SRAM circuits because the matrix contains a high proportion of cells that are not accessed for extended periods of time. This paper presents a memory that by use of small granular control of the supply voltages can succeed in gaining at least a factor 10 in total power reduction. Using a distributed last stage of the SRAM decoder the stand-by and active cycle of the SRAM matrix can be controlled per word. This allows to selectively wake-Lip only the needed word and peripheral circuitry. When combined with monitoring and DC-DC conversion circuitry for the stand-by voltage, a closed loop system is attained that can minimise power consumption in the SRAM matrix. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1776 / 1782
页数:7
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