Random telegraph noise investigation in irradiated digital SiPMs

Digital SiPM is a very attractive solution for single-photon detection due to its excellent timing resolution and the additional pixel circuitry capability for signal processing. Possible applications often require the device to be operated in a high-radiation environment. In this work, we investigate the degradation of the device performances after irradiation with protons. We report on the increase of the dark count rate level and the random telegraph noise occurrence, i.e., the discrete switching of the dark count rate between two or more values. Results have been compared with the most accurate models proposed in the literature.