Preparation and electrical properties of lead-free Bi0.5(Na0.4K0.6)0.5TiO3 thin films

被引：1
|
作者：
Yang, CH [1 ]
Wang, Z [1 ]
Ma, GP [1 ]
Gu, SL [1 ]
Yang, YG [1 ]
Yang, DM [1 ]
Han, JR [1 ]
机构：
[1] Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China
来源：
SURFACE REVIEW AND LETTERS | 2005年 / 12卷 / 03期
基金：
中国国家自然科学基金;
关键词：
thin films; X-ray diffraction; atomic force microscopy; electrical properties;
D O I：
10.1142/S0218625X05007220
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Lead-free Bi-0.5 (Na0.4K0.6)(0.5)TiO3 films have been synthesized by a chemical solution deposition method and deposited on p-Si(111) substrate by spin coating. Powder of the precursor solution heated at 650 degrees C was studied by infrared scattering spectroscopy. The structural characteristics and crystallization of the films were examined by X-ray diffraction. The surface morphology and quality were studied using atomic force microscopy. The films exhibit good insulating properties and resistance to breakdown. The clockwise hysteresis curve is referred to as polarization type switching and the memory window is about 1.5 V.
引用
收藏
页码：409 / 412
页数：4
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