Sine-wave signal characterization using square-wave and ΣΔ-modulation:: Application to mixed-signal BIST

被引：10

作者：

Vázquez, D ^{[1
]}

Huertas, G ^{[1
]}

Luque, A ^{[1
]}

Barragán, MJ ^{[1
]}

Leger, G ^{[1
]}

Rueda, A ^{[1
]}

Huertas, JL ^{[1
]}

机构：

[1] Univ Sevilla, CNM, IMSE, E-41012 Seville, Spain

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2005年 / 21卷 / 03期

关键词：

mixed-signal testing; analog testing; BIST; sigma-delta modulation;

D O I：

10.1007/s10836-005-6352-x

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. It is based on a double-modulation, square-wave and sigma-delta, together with a simple Digital Processing Algorithm. It leads to an efficient and robust approach very suitable for BIST applications. In this line, some considerations for on-chip implementation are addressed together with simulation results that validate the feasibility of the proposed approach.

引用

页码：221 / 232

页数：12

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