Sine-wave signal characterization using square-wave and ΣΔ-modulation:: Application to mixed-signal BIST

被引：10
|
作者：
Vázquez, D [1 ]
Huertas, G [1 ]
Luque, A [1 ]
Barragán, MJ [1 ]
Leger, G [1 ]
Rueda, A [1 ]
Huertas, JL [1 ]
机构：
[1] Univ Sevilla, CNM, IMSE, E-41012 Seville, Spain
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2005年 / 21卷 / 03期
关键词：
mixed-signal testing; analog testing; BIST; sigma-delta modulation;
D O I：
10.1007/s10836-005-6352-x
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. It is based on a double-modulation, square-wave and sigma-delta, together with a simple Digital Processing Algorithm. It leads to an efficient and robust approach very suitable for BIST applications. In this line, some considerations for on-chip implementation are addressed together with simulation results that validate the feasibility of the proposed approach.
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页码：221 / 232
页数：12
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