Scaling Trends and Challenges of Advanced Memory Technology

被引：0
|
作者：
Lee, Seok-Hee [1 ]
机构：
[1] SK Hynix, R&D Div, Ichon 467701, Kyoungki Do, South Korea
来源：
2014 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | 2014年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页数：1
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