A novel in situ atomic force microscopy imaging technique to probe surface morphological features of starch granules

The application of atomic force microscopy (AFM) for observing iodine complexes in starch has been limited due to limitations including granular sample fixation techniques and possible unintended reactions with embedding materials such as epoxy resins or adhesives. In this paper, a new method is described that employs an optical microscopic technique to ensure that the tip of the AFM is scanning a specified granule without any probe-induced particle movement by the AFM probe motion. The direct sprinkling of samples on a two-sided adhesive tape allows investigations in an in situ environment of the unembedded starch granule surface and thus provides high-resolution images of granule morphology and phase changes of starches in the presence of humidity and with iodine vapor. These observations demonstrate that this novel in situ AFM imaging technique allows us to visualize the hair-like structures on the surface of granular starches when starches are exposed to iodine vapor under humid environments. This study reveals that the hair-like extensions on the starch granule surfaces are strongly dependent on the organization of the glucan polymers within corn or potato starch. (C) 2011 Elsevier Ltd. All rights reserved.