Introduction to the Extreme Environment Technology and Reliability Special Issue

被引：0

作者：

Chen, Yuan ^{[1
]}

Mojarradi, Mohammad ^{[2
]}

Suehle, John ^{[3
]}

Westergard, Lynett ^{[4
]}

机构：

[1] NASA, Hampton, VA USA

[2] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

[3] NIST, Gaithersburg, MD 20899 USA

[4] ON Semicond, Phoenix, AZ 85008 USA

来源：

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2010年 / 10卷 / 04期

关键词：

D O I：

10.1109/TDMR.2010.2088810

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：417 / 417

页数：1

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