Presentation of new automatic test and repair system

被引：0
|
作者：
Kritzer, C [1 ]
机构：
[1] Israel Aircraft Ind IAI Ltd, Components Div, Bedek Aviat Grp, IL-70100 Ben Gurion Int Airport, Israel
来源：
1998 IEEE AUTOTESTCON PROCEEDINGS - IEEE SYSTEMS READINESS TECHNOLOGY CONFERENCE | 1998年
关键词：
D O I：
10.1109/AUTEST.1998.713495
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
New design approach for building flexible test and repair system. The concept of the new design Is to separate the data acquisition process from the test and analysis process. That is accomplished by using modern software tools and parallel computing. The system was developed by the art of the state of current software tools like: LabWindows CVI(TM) and Microsoft Visual C++ (R).
引用
收藏
页码：543 / 545
页数：3
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