A comparison between foundations of metrology and software measurement

被引：10
|
作者：
Carbone, Paolo [1 ]
Buglione, Luigi [2 ,3 ]
Mari, Luca [5 ]
Petri, Dario [4 ]
机构：
[1] Univ Perugia, Dept Elect & Informat Engn, I-06125 Perugia 93, Italy
[2] Univ Quebec, Ecole Technol Super, Montreal, PQ H3C 1K3, Canada
[3] Atos Origin, I-00148 Rome 32, Italy
[4] Univ Trent, Dept Informat & Commun Technol, I-38050 Trento 14, Italy
[5] Univ Carlo Cattaneo, LIUC, I-21053 Castellanza 22, Italy
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2008年 / 57卷 / 02期
关键词：
measurement design; measurement modeling; measurement uncertainty; metrology; software measurement;
D O I：
10.1109/TIM.2007.909614
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we discuss basic issues related to measurements performed in the domains of software engineering and metrology. Similarities and differences are highlighted, with the aim of analyzing the level of knowledge in both domains. A theoretical approach is followed, allowing the proposal of a measurement process model, which is used as a guiding scheme throughout the paper to illustrate peculiarities arising when taking software measurements. Common ground between metrologists and software engineers are described by discussing foundations of measurement in the software context.
引用
收藏
页码：235 / 241
页数：7
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