Wiring Diagnostics Via l1-Regularized Least Squares

被引:3
|
作者
Schuet, Stefan [1 ]
机构
[1] NASA, Ames Res Ctr, Intelligent Syst Div, Moffett Field, CA 94035 USA
关键词
Diagnostics; fault detection; inverse scattering; lossless media; sparsity; time domain reflectometry (TDR); wiring; REFLECTOMETRY;
D O I
10.1109/JSEN.2009.2037823
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new method for detecting and locating wiring damage using time domain reflectometry with arbitrary input interrogation signals is presented. This method employs existing l(1) regularization techniques from convex optimization and compressed sensing to exploit sparsity in the distribution of faults along the length of a wire, while further generalizing and improving commonly used fault detection techniques based on sliding correlation and peak detection. The method's effectiveness is demonstrated using a simulated example, and it is shown how Monte Carlo techniques are used to tune it to achieve specific detection goals, like a certain false positive error rate. Furthermore, the method is easily implemented by adapting readily available optimization algorithms to quickly solve large, high resolution, versions of this estimation problem. Finally, the technique is applied to a real data set, which reveals its impressive ability to identify a subtle type of chafing damage on real wire.
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页码:1218 / 1225
页数:8
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