AGING-AWARE ADAPTIVE VOLTAGE SCALING OF PRODUCT BLOCKS IN 28NM NODES

被引：0
|
作者：
Huard, V. [1 ]
Cacho, F. [1 ]
Benhassain, A. [1 ,2 ]
Parthasarathy, C. [1 ]
机构：
[1] STMicroelectronics, REER, 850 Rue Jean Monnet, F-38926 Crolles, France
[2] TIMA, 46 Ave Felix Viallet, F-38031 Grenoble, France
来源：
2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2016年
关键词：
reliability; adaptive; voltage scaling; decoder; microprocessor; guardband; product qualification; energy efficiency; AVS; failure rate;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
this work provides elements to highlight the fundamental elements towards an Aging-aware Adaptive Voltage Scaling (A-AVS) scheme of digital circuits. Through main milestones including monitors' definition and insertion flow, monitors' characterization (mean and spread), the A-AVS scheme is assessed on real product blocks in 28nm High-K nodes. This study offers new perspectives towards the trade-off between product hardening and energy efficiency with respect to aging-induced slow-down, especially in context where Adaptive Voltage Scaling (AVS) is used to compensate for process centerings.
引用
收藏
页数：7
相关论文
共 50 条
  • [1] On Aging-Aware Signoff for Circuits With Adaptive Voltage Scaling
    Chan, Tuck-Boon
    Chan, Wei-Ting Jonas
    Kahng, Andrew B.
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2014, 61 (10) : 2920 - 2930
  • [2] Impact of Adaptive Voltage Scaling on Aging-Aware Signoff
    Chan, Tuck-Boon
    Chan, Wei-Ting Jonas
    Kahng, Andrew B.
    [J]. DESIGN, AUTOMATION & TEST IN EUROPE, 2013, : 1683 - 1688
  • [3] Aging-Aware Voltage Scaling
    van Santen, Victor M.
    Amrouch, Hussam
    Parihar, Narendra
    Mahapatra, Souvik
    Henkel, Joerg
    [J]. PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, : 576 - 581
  • [4] Adaptive Accelerated Aging with 28nm HKMG Technology
    Patra, Devyani
    Reza, Ahmed Kamal
    Hassan, Mohammed Khaled
    Katoozi, Mehdi
    Cannon, Ethan H.
    Roy, Kaushik
    Cao, Yu
    [J]. 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2017,
  • [5] Adaptive Voltage Frequency Scaling using Critical Path Accumulator implemented in 28nm CPU
    Sundaram, Sriram
    Samabmurthy, Sriram
    Austin, Michael
    Grenat, Aaron
    Golden, Michael
    Kosonocky, Stephen
    Naffziger, Samuel
    [J]. 2016 29TH INTERNATIONAL CONFERENCE ON VLSI DESIGN AND 2016 15TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS (VLSID), 2016, : 565 - 566
  • [6] Aging-Aware Adaptive Voltage Scaling in 22nm High-K/Metal-Gate Tri-Gate CMOS
    Cho, Minki
    Tokunaga, Carlos
    Khellah, Muhammad M.
    Tschanz, James W.
    De, Vivek
    [J]. 2015 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2015,
  • [7] Sub-microsecond Adaptive Voltage Scaling in a 28nm FD-SOI Processor SoC
    Keller, Ben
    Cochet, Martin
    Zimmer, Brian
    Lee, Yunsup
    Blagojevic, Milovan
    Kwak, Jaehwa
    Puggelli, Alberto
    Bailey, Stevo
    Chiu, Pi-Feng
    Dabbelt, Palmer
    Schmidt, Colin
    Alon, Elad
    Asanovic, Krste
    Nikolic, Borivoje
    [J]. ESSCIRC CONFERENCE 2016, 2016, : 269 - 272
  • [8] Capacitance Scaling Aware Power Optimized Register Design And Implementation on 28nm FPGA
    Banshal, Sumit Kumar
    Pandey, Bishwajeet
    Brenda, S. J.
    [J]. 2014 INTERNATIONAL CONFERENCE ON COMPUTER COMMUNICATION AND INFORMATICS (ICCCI), 2014,
  • [9] Ultra-Low Voltage Datapath Blocks in 28nm UTBB FD-SOI
    Reyserhove, Hans
    Reynders, Nele
    Dehaene, Wim
    [J]. 2014 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC), 2014, : 49 - 52
  • [10] Prediction of Thermally Accelerated Aging Process at 28nm
    Chanawala, Parvez Anwar
    Hill, Ian
    Sheikholeslam, S. Arash
    Ivanov, Andre
    [J]. 2022 IEEE EUROPEAN TEST SYMPOSIUM (ETS 2022), 2022,
12345