Review of degradation and failure phenomena in photovoltaic modules

被引:233
|
作者
Aghaei, M. [1 ,2 ]
Fairbrother, A. [3 ]
Gok, A. [4 ]
Ahmad, S. [5 ,6 ]
Kazim, S. [5 ,6 ]
Lobato, K. [7 ]
Oreski, G. [8 ]
Reinders, A. [1 ,9 ]
Schmitz, J. [10 ]
Theelen, M. [11 ]
Yilmaz, P. [10 ,11 ]
Kettle, J. [12 ]
机构
[1] Eindhoven Univ Technol, Dept Mech Engn, Energy Technol Grp, NL-5612 AE Eindhoven, Netherlands
[2] Norwegian Univ Sci & Technol NTNU, Dept Ocean Operat & Civil Engn, N-6009 Alesund, Norway
[3] Ecole Polytech Fed Lausanne EPFL, Photovolta & Thin Film Elect Lab, Inst Elect & Micro Engn IEM, Rue Maladiere 71b, CH-2002 Neuchatel, Switzerland
[4] Gebze Tech Univ, Dept Mat Sci & Engn, TR-41400 Kocaeli, Turkey
[5] Univ Basque Country, Basque Ctr Mat Applicat & Nanostruct, BCMat, Sci Pk, Leioa 48940, Spain
[6] Basque Fdn Sci, Ikerbasque, Bilbao 48009, Spain
[7] Univ Lisbon, Fac Ciencias, Inst Dom Luiz, P-1749016 Lisbon, Portugal
[8] Polymer Competence Ctr Leoben GmbH, Roseggerstr 12, A-8700 Leoben, Austria
[9] Univ Twente, Fac Engn Technol, Dept Design Prod & Management, NL-7500 AE Enschede, Netherlands
[10] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
[11] TNO Partner Solliance, High Tech Campus 21, NL-5656 AE Eindhoven, Netherlands
[12] Univ Glasgow, James Watt Sch Engn, Glasgow, Lanark, Scotland
来源
关键词
solar Modules; Solar cells; Photovoltaics; Reliability; Degradation; Wear-out; Stress; Climate; Energy payback time; POTENTIAL-INDUCED DEGRADATION; THIN-FILM CU(IN; GA)SE-2; TISO-10-KW SOLAR PLANT; LIFE-CYCLE ASSESSMENT; SILICON PV MODULES; CRYSTALLINE-SILICON; ENCAPSULANT DISCOLORATION; SYSTEM PERFORMANCE; RENEWABLE ENERGY; AGING BEHAVIOR;
D O I
10.1016/j.rser.2022.112160
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
The degradation of photovoltaic (PV) systems is one of the key factors to address in order to reduce the cost of the electricity produced by increasing the operational lifetime of PV systems. To reduce the degradation, it is imperative to know the degradation and failure phenomena. This review article has been prepared to present an overview of the state-of-the-art knowledge on the reliability of PV modules. Whilst the most common technology today is mono- and multi-crystalline silicon, this article aims to give a generic summary which is relevant for a wider range of photovoltaic technologies including cadmium telluride, copper indium gallium selenide and emerging low-cost high-efficiency technologies. The review consists of three parts: firstly, a brief contextual summary about reliability metrics and how reliability is measured. Secondly, a summary of the main stress factors and how they influence module degradation. Finally, a detailed review of degradation and failure modes, which has been partitioned by the individual component within a PV module. This section connects the degradation phenomena and failure modes to the module component, and its effects on the PV system. Building on this knowledge, strategies to improve the operational lifetime of PV systems and thus, to reduce the electricity cost can be devised. Through extensive testing and failure analysis, researchers now have a much better overview of stressors and their impact on long term stability.
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页数:18
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