Application of decreasing integrated hazard in Rahim and Banerjee model on economic design of (X)over-bar-control charts for systems with increasing failure rate and early replacement

被引:4
|
作者
Pasha, M. A. [1 ]
Khadem, Y. [1 ]
Moghadam, M. B. [1 ]
机构
[1] Allameh Tabatabai Univ, Dept Stat, Beheshti Ghasir Ave, Tehran 1513615411, Iran
关键词
Economic design (ED); Economic statistical design (ESD); Increasing failure rate (IFR); Integrated hazard over sampling interval (IHI); Process failure mechanism (PFM); STATISTICAL DESIGN;
D O I
10.1080/03610926.2016.1236962
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
In comparison to economic designs of (X) over bar -control charts with constant integrated hazard over sampling intervals, a new approach is proposed that warranty the integrated hazard is decreasing throughout the time. The generalized model of Rahim and Banerjee (1993) is applied to achieve the optimal design parameters for systems with increasing failure rate and early replacement. Some numerical examples utilizing Weibull(nu, lambda) and Gamma(2, lambda) in-control time distributions are presented to evaluate the performance of the approach. Both the economic and economic statistical models are used to compare the decreasing integrated hazard approach with the constant one. A comprehensive sensitivity analysis is also presented.
引用
收藏
页码:10481 / 10494
页数:14
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