Millimeter-wave scanning near-field anisotropy microscopy

A millimeter-wave scanning near-field microscopy using a slit-type probe, which permits the observation of electrical anisotropy in the viewed object, is proposed. The slit probe is sensitive to any electrical anisotropy along the object surface direction that is inherent in the object to be imaged, because the electric field at its aperture is linearly polarized. An electrical anisotropy model is incorporated into the image reconstruction process that enables two-dimensional image reconstruction. The details of the model and the reconstruction method adopted in this work are described and experimental results to demonstrate the feasibility of this microscopy format are presented. (C) 2005 American Institute of Physics.