Ultra-small-angle X-ray scattering study of PET/PC nanolayers and comparison to AFM results

被引：9

作者：

Ania, Fernando ^{[1
]}

Puente-Orench, Ines ^{[1
]}

Calleja, Francisco J. Balta ^{[1
]}

Khariwala, Devang ^{[2
]}

Hiltner, Anne ^{[2
]}

Baer, Eric ^{[2
]}

Roth, Stephan V. ^{[3
]}

机构：

[1] CSIC, Inst Estructura Mat, E-28006 Madrid, Spain

[2] Case Western Reserve Univ, Dept Macromol Sci, Cleveland, OH 44106 USA

[3] Deutsch Elektronen Synchrotron HASYLAB, D-22603 Hamburg, Germany

来源：

MACROMOLECULAR CHEMISTRY AND PHYSICS | 2008年 / 209卷 / 13期

关键词：

atomic force microscopy (AFM); co-extrusion; nanolayers; structure; ultra-small-angle X-ray scattering (USAXS);

D O I：

10.1002/macp.200700639

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

The forced assembly of two immiscible polymers, produced by layer-multiplying co-extrusion, is analyzed by means of USAXS. Comparison of scattering and AFM results sheds light on many details of the nanolayered structure in PET/PC films. The role played by the volume concentration and cold crystallization of PET on the experimental scattering is discussed. The appearance of at least two scattering maxima in all cases, corresponding to higher orders of the same repeating distance, accounts for the high regularity of the developed nanostructure. It is finally shown that long spacing values, derived from a localized area in AFM, are in a good agreement with the USAXS values averaged over much larger areas.

引用

页码：1367 / 1373

页数：7

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