Recent Developments in Black Phosphorous Transistors: A Review

被引:0
|
作者
Pon, Adhithan [1 ]
Bhattacharyya, Arkaprava [1 ]
Rathinam, Ramesh [1 ]
机构
[1] SASTRA, Sch Elect & Elect Engn, Device Modeling Lab, Thanjavur, India
关键词
2D material; black phosphorous; phosphorene; TCAD; DFT; MOSFET; TFET; FIELD-EFFECT TRANSISTORS; ELECTRICAL-PROPERTIES; ELECTRONIC-PROPERTIES; THERMAL-CONDUCTIVITY; OPTICAL-PROPERTIES; CRYSTAL-STRUCTURE; COMPACT MODEL; GRAPHENE; PERFORMANCE; MOSFETS;
D O I
10.1007/s11664-021-09183-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two-dimensional (2D) materials like graphene, phosphorene, germanene, silicene, and transition metal dichalcogenides have attracted intense research attention because of their rich physics and potential for integration into next-generation electronic devices. These materials offer superior electrostatic control to their bulk counterparts, which makes them fascinating for device fabrication. After graphene and MoS2, the most intensively explored 2D material is black phosphorus (BP). During the past half-decade, BP has notably achieved excellent performance when included in transistors. This review paper aims to throw some light on BP properties and their performance in a field effect transistor device. The state-of-the-art BP transistors are reviewed, and a balanced view of both the benefits and drawbacks is provided.
引用
收藏
页码:6020 / 6036
页数:17
相关论文
共 50 条