Quantitative X-ray fluorescence analysis using fundamental parameters: Application to gold jewelry

被引：0
|
作者：
Honkimaki, V
Hamalainen, K
Manninen, S
机构：
来源：
X-RAY SPECTROMETRY | 1996年 / 25卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The fundamental parameter method was applied to the quantitative x-ray fluorescence analysis of gold jewelry samples. The fluorescence spectra were acquired using monochromatic and focused W K alpha(1) radiation (59.32 keV) from a high-voltage x-ray tube and a Ge solid-state detector. A novel program package based on a whole-pattern fitting procedure including corrections for secondary fluorescence and escape peaks was developed. The accuracy of this method was tested by analyzing samples characterized with independent techniques.
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页码：215 / 220
页数：6
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