Improved Characteristics of Intrinsically Shunted Nb/Al - AlOx - Nb Josephson Junctions

被引:1
|
作者
Lacquaniti, Vincenzo [1 ]
De Leo, Natascia [1 ]
Fretto, Matteo [1 ]
Sosso, Andrea [1 ]
Andreone, Domenico [1 ]
Belogolovskii, Mikhail [1 ]
机构
[1] Ist Nazl Ric Metrol INRIM, Electromagnetism Dept, I-10135 Turin, Italy
关键词
Intrinsic shunting; shapiro steps; SNIS Josephson junctions; voltage metrology; TUNNEL-JUNCTIONS;
D O I
10.1109/TASC.2010.2080656
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Josephson junctions with non-hysteretic current-voltage characteristics form the basis of most superconducting electronic circuits including RSFQ logic and programmable Josephson voltage standards. In contrast to conventional SIS devices, Nb/Al AlOx - Nb (SNIS) junctions with an additional comparatively thick Al interlayer and a comparatively thin barrier AlOx are intrinsically shunted at T >= 4.2 K. In this contribution, we provide experimental and theoretical arguments proving that this finding is mainly explained by a broad distribution of highly-conductive barrier transparencies with a significant effect from nearly ballistic modes. An additional advantage of the proposed SNIS junctions is possibility to tune the critical voltage value by modifying Nb and/or Al film thicknesses. With observations of wide Shapiro steps up to 1.25 V at 6.3 K we show that this type of Josephson junctions can be successfully used at temperatures above 4.2 K. The presence of well-developed quantized voltage features even at 7.2 K means that Nb/Al - AlOx- Nb devices can successfully operate far above the liquid helium temperature and, in principle, are compatible with two-stage cryocoolers.
引用
收藏
页码:111 / 114
页数:4
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