Study of head-disk interference at low-flying height

被引:14
|
作者
Li, ZF [1 ]
Chen, CY [1 ]
Liu, JJ [1 ]
机构
[1] MMC Technol, San Jose, CA 95131 USA
关键词
flyability; low-flying height; lubricant pickup; wear;
D O I
10.1109/TMAG.2003.816438
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As the head-disk clearance is reduced to 10 nm or less, maintaining good flyability performance is crucial to ensure the robustness of the head-disk-interface. In this paper, the head mechanical degradation, which includes both lubricant pickup and head wear, is studied as the flying height approaches zero. Three different flying regimes are observed as the flying height is reduced: good flyability regime, lubricant pickup regime, and near contact regime. To minimize the lubricant smears on flying heads, the effect of the lubricant bonded ratio was investigated, and it was found that the lubricant pickup on the head is reduced with less amount of free lubricant on the disk surface.
引用
收藏
页码:2462 / 2464
页数:3
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