Superior thermal stability in Ag/Nb multilayers by different interfacial structures

被引:2
|
作者
Wei, M. Z. [1 ]
Huo, J. Z. [1 ]
Ye, C. Z. [1 ]
Cao, Z. H. [2 ,3 ]
机构
[1] Linyi Univ, Inst Phys & Elect Engn, Linyi 276000, Shandong, Peoples R China
[2] Nanjing Univ, Coll Engn & Appl Sci, Inst Mat Engn, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
[3] Nanjing Tech Univ, Coll Mat Sci & Engn, Tech Inst Adv Mat, Nanjing 210009, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
SOLID-STATE AMORPHIZATION; HIGH-STRENGTH; HARDNESS; MICROSTRUCTURE; DEFORMATION; ENHANCEMENT; TWINS;
D O I
10.1063/1.5138986
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, the thermal stability of annealed Ag/Nb multilayers was investigated as the individual layer thickness (h) varies from 1 nm to 100 nm. The lamellar structures remain unchanged after annealing at 500 degrees C for 1 h, and the hardness at all scales remains undiminished after annealing. The results show that two low energy interfaces are responsible for the superior thermal stabilities. The coherent interface is formed when h < 20 nm, and the amorphous interface is formed when h >= 20 nm, respectively. The evolution of interfacial structures and the process of solid state amorphization are discussed accordingly.
引用
收藏
页数:6
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