Structural and ferroic properties of Zr-doped BiFeO3 thin films

被引：34
|
作者：
Wang, Yao
Nan, Ce-Wen [1 ]
机构：
[1] Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Dept Mat Sci & Engn, Beijing 100084, Peoples R China
来源：
FERROELECTRICS | 2007年 / 357卷
关键词：
thin films; ferroelectric; ferromagnetic;
D O I：
10.1080/00150190701542844
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Polycrystalline Zr-doped BiFeO3 thin films were prepared by a sol-gel spin-coating technique on (111) Pt/Ti/SiO2/Si substrates. The films are of single phase as evidenced by X-ray diffraction, and microstructure characterization on the surface and cross-section morphology of the films was carried out by scanning electron microscope. By introducing a small amount of Zr ions into the sol-gel solution-processed BiFeO3 films, the leakage current density is reduced by three orders of magnitude compared with the undoped BiFeO3 films, and the conduction mechanism in the BiFeO3 -based films was studied. Both the films exhibit weak ferromagnetism of 25 emu/cm(3) at room temperature.
引用
收藏
页码：172 / 178
页数：7
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