Analog signal metrology for mixed signal ICs

被引：0
|
作者：
Su, CC
Cheng, YR
Chen, YT
Tenchen, S
机构：
来源：
SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ATS.1997.643958
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
Signal reconstruction reconstructs a multiple-period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20MHz 8-bit ADC.
引用
收藏
页码：194 / 199
页数：6
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