Analog signal metrology for mixed signal ICs

被引：0

作者：

Su, CC

Cheng, YR

Chen, YT

Tenchen, S

机构：

来源：

SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS | 1997年

关键词：

D O I：

10.1109/ATS.1997.643958

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Signal reconstruction reconstructs a multiple-period low-rate sampled waveform into a one-period high-rate sampled waveform. With which, we are able to provide sufficient samples of analog signals for DSP based testing using on-chip ADCs. Test results show that a 128-sample-per-period waveform can be reconstructed from a 2.4 samples per period waveform sampled by a 20MHz 8-bit ADC.

引用

页码：194 / 199

页数：6

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