Ultrasonic crack growth monitoring using the satellite pulse crack tip diffraction through-wall depth sizing technique

被引：0
|
作者：
Bagarry, AA [1 ]
机构：
[1] Hellier Pacific, Fullerton, CA 92833 USA
来源：
MATERIALS EVALUATION | 1999年 / 57卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：36 / 38
页数：3
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