Ultrasonic crack growth monitoring using the satellite pulse crack tip diffraction through-wall depth sizing technique

被引：0

作者：

Bagarry, AA ^{[1
]}

机构：

[1] Hellier Pacific, Fullerton, CA 92833 USA

来源：

MATERIALS EVALUATION | 1999年 / 57卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：36 / 38

页数：3

共 50 条

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