Experimental measurements of Xe and Kr releases from UO2 and determination of their migration mechanisms - Release rate data

被引：0

作者：

Gerardin, M. ^{[1
,2
]}

Gilabert, E. ^{[3
]}

Horlait, D. ^{[3
]}

Barthe, M-F. ^{[4
]}

Carlot, G. ^{[1
]}

机构：

[1] CEA, DEN, DEC, F-13108 St Paul Les Durance, France

[2] Univ Lorraine, CNRS, GeoRessources, F-F54000 Nancy, France

[3] Univ Bordeaux, CNRS, CENBG, IN2P3, F-33170 Gradignan, France

[4] Univ Orleans, CNRS, CEMHTI, 3A Rue Ferollerie, F-45071 Orleans 2, France

来源：

DATA IN BRIEF | 2021年 / 39卷

关键词：

Uranium dioxide; Xenon and krypton release; Diffusion; Radiation induced defects;

D O I：

10.1016/j.dib.2021.107645

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

We present the raw data obtained from release rate at 1300 degrees C of Xe and Kr implanted in UO2, related to [1]. We performed different sample preparation (polishing treatment) on polycrystalline and monocrystalline UO2. Ion implantation were performed at various fluences between 9.5 x 10(10) to 5 x 10(14) i/cm(2) in UO2 samples. Release rate of Xe and Kr are obtained at 1300 degrees C under vacuum from desorption experiments performed on the PIAGARA plateform at the CENBG (Centre d'Etudes Nucleaires de Bordeaux-Gradignan). Since we made a variety of samples depending on multiple parameters (sample type, sample preparation, ion implantation type and fluence), these data represent a serious amount of work that could be saved for the scientific community that might use them for other purposes such as burst modelling. (C) 2021 Published by Elsevier Inc.

引用

页数：4

共 19 条

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