Infinitesimal diffraction model for mobile wireless communication systems

被引：4
|
作者：
Oestges, C
Vanhoenacker-Janvier, D
机构：
[1] Stanford Univ, Informat Syst Lab, Stanford, CA 94305 USA
[2] Univ Catholique Louvain, Microwave Lab, B-1348 Louvain, Belgium
来源：
ELECTRONICS LETTERS | 2001年 / 37卷 / 13期
关键词：
D O I：
10.1049/el:20010550
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new diffraction method that yields realistic simulations of the mobile channel in built-up areas is presented. The new model, using UTD-based edge equivalent currents, allows for integrating the finite dimension of building wedges in the field estimation, A comparison with 1.6GHz experimental data shows good agreement in terms of level-crossing rate, in contrast to results obtained with the basic UTD.
引用
收藏
页码：856 / 858
页数：3
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