Amorphous Silicon Carbide Nanowires for Optical Sensor Device

被引：3
|
作者：
Boukezzata, A. [1 ]
Bouanik, S. [1 ]
Manseri, A. [1 ]
Kaci, S. [1 ]
Menari, H. [1 ]
Mahmoudi, B. [1 ]
机构：
[1] Ctr Rech Technol Semicond Energet CRTSE, Couches Minces Surfaces & Interfaces CMSI, Algiers, Algeria
来源：
ACTA PHYSICA POLONICA A | 2020年 / 137卷 / 04期
关键词：
SIC NANOWIRES; THIN-FILMS; HYDROGEN; WATER;
D O I：
10.12693/APhysPolA.137.447
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
In this study, amorphous silicon carbide nanowires (NWASC) on Si substrates were fabricated by depositing hydrogenated amorphous SiC thin films on silicon nanowire by RF magnetron sputtering, with different thicknesses. The scanning electron microscopy showed the formation of nanostructured NWASC and strong photoluminescence intensity was noticed. Due to the large surface area and the high stability, the SiC nanowires were used as the Schottky diode optical sensor device (Au/NWASC/Si/Al). The results presented in this work show the impact of the thickness and the surface structuring on the optoelectronic properties of amorphous SiC thin films. Finally, a high photocurrent and high relative spectral response value of Au/NWASC/Si/Al were observed for the thinner amorphous SiC layer.
引用
收藏
页码：447 / 450
页数：4
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