Synthesis and characterization in AuCu-Si nanostructures

被引：3
|
作者：
Novelo, T. E. [1 ]
Amezaga-Madrid, P. [1 ]
Maldonado, R. D. [2 ]
Oliva, A. I. [3 ]
Alonzo-Medina, G. M. [2 ]
机构：
[1] Ctr Invest Mat Avanzados SC, Lab Nacl Nanotecnol, Chihuahua 31109, Mexico
[2] Univ Anahuac Mayab, Merida 97310, Yucatan, Mexico
[3] Ctr Invest & Estudios Avanzados IPN Unidad Merida, Dept Fis Aplicada, Merida 97310, Yucatan, Mexico
来源：
MATERIALS CHARACTERIZATION | 2015年 / 101卷
关键词：
AuCu alloy; CuSi alloy; Thermal diffusion; Nanostructure alloy; ELECTRONIC-STRUCTURE; ATOMIC DIFFUSION; FILMS; CU; GOLD; SILICON; SURFACE; GROWTH;
D O I：
10.1016/j.matchar.2015.01.010
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au2Cu3 and Au3Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys. (C) 2015 Elsevier Inc All rights reserved.
引用
收藏
页码：83 / 89
页数：7
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