Electric-field-induced narrowing of exciton linewidth

被引:6
|
作者
Ponomarev, IV [1 ]
Deych, LI [1 ]
Lisyansky, AA [1 ]
机构
[1] CUNY Queens Coll, Dept Phys, Flushing, NY 11367 USA
关键词
D O I
10.1103/PhysRevB.72.115304
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Considering the effects of the electric field on the low temperature absorption line of quantum well excitons, we show that, for moderate strength of the electric field, the main contribution to the field dependence of the linewidth results from the field induced modifications of the inhomogeneous broadening of excitons. We find that the strength of the random potential acting on the quantum well excitons due to alloy disorder and interface roughness can either decrease or increase with the field depending upon the thickness of the well. This means that under certain conditions one can observe counterintuitive narrowing of the exciton spectral lines in an electric field.
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页数:5
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