A Novel 3d Profile Measurement Method Based On Digital Photoelastic Technology

被引:1
|
作者
Chen, Guanjun [1 ]
Tao, Bo [1 ]
Li, Gongfa [1 ]
Xu, Shuang [2 ]
Zeng, Fei [2 ]
机构
[1] Wuhan Univ Sci & Technol, Minist Educ, Key Lab Met Equipment & Control Technol, Wuhan 430081, Peoples R China
[2] Wuhan Univ Sci & Technol, Hubei Key Lab Mech Transmiss & Mfg Engn, Wuhan 430081, Peoples R China
基金
中国国家自然科学基金;
关键词
three-dimensional profile measurement method; digital photoelasticity; isochromatic parameter; structured-light pattern; PROFILOMETRY; SYSTEM;
D O I
10.1117/12.2549919
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A three-dimensional profile measurement method based on digital photoelastic fringe analysis technology is proposed in this paper. According to the actual stress field of a disc under appropriate load, the photoelastic fringe patterns are generated. These patterns are illuminated on the reference plane and objects through a projector, which are regarded as the structured-light pattern sequence. Then a series of images including normal images and deformed fringe images are captured. These images contain two significant photoelastic parameters, isoclinic parameter and isochromatic parameter, which could be evaluated by the phase shifting method. Therefore, phase differences can be calculated by photoelastic isochromatic parameter after phase unwrapping. Depth information is carried in the phase differences and virtual 3D profile equal to real objects could be reconstructed. Experiments demonstrate that this method is robust and suitable for measuring objects with regular and general shape.
引用
收藏
页数:7
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