A Novel 3d Profile Measurement Method Based On Digital Photoelastic Technology

被引:1
|
作者
Chen, Guanjun [1 ]
Tao, Bo [1 ]
Li, Gongfa [1 ]
Xu, Shuang [2 ]
Zeng, Fei [2 ]
机构
[1] Wuhan Univ Sci & Technol, Minist Educ, Key Lab Met Equipment & Control Technol, Wuhan 430081, Peoples R China
[2] Wuhan Univ Sci & Technol, Hubei Key Lab Mech Transmiss & Mfg Engn, Wuhan 430081, Peoples R China
基金
中国国家自然科学基金;
关键词
three-dimensional profile measurement method; digital photoelasticity; isochromatic parameter; structured-light pattern; PROFILOMETRY; SYSTEM;
D O I
10.1117/12.2549919
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A three-dimensional profile measurement method based on digital photoelastic fringe analysis technology is proposed in this paper. According to the actual stress field of a disc under appropriate load, the photoelastic fringe patterns are generated. These patterns are illuminated on the reference plane and objects through a projector, which are regarded as the structured-light pattern sequence. Then a series of images including normal images and deformed fringe images are captured. These images contain two significant photoelastic parameters, isoclinic parameter and isochromatic parameter, which could be evaluated by the phase shifting method. Therefore, phase differences can be calculated by photoelastic isochromatic parameter after phase unwrapping. Depth information is carried in the phase differences and virtual 3D profile equal to real objects could be reconstructed. Experiments demonstrate that this method is robust and suitable for measuring objects with regular and general shape.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Inverse analysis method for photoelastic measurement of 3D stress state
    Wijerathne, MLL
    Oguni, K
    Hori, M
    ADVANCES IN FRACTURE AND FAILURE PREVENTION, PTS 1 AND 2, 2004, 261-263 : 753 - 758
  • [2] 3D roughness obtaining method of rock joint based on profile measurement
    Gu Yan
    Yong Rui
    Shen Wei
    Du Shi-gui
    Jian Jie-dong
    Liu Song-lin
    ROCK AND SOIL MECHANICS, 2023, 44 : 485 - 494
  • [3] A 3D Profile Measurement Method Based on Color Composite Grating Projection
    Cheng, Yin
    Yu, Demin
    PROCEEDINGS OF 2010 ASIA-PACIFIC YOUTH CONFERENCE ON COMMUNICATION, VOLS 1 AND 2, 2010, : 167 - 171
  • [4] Design of measurement system of 3D surface profile based on chromatic confocal technology
    Wang An-su
    Xie Bin
    Liu Zi-wei
    2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTICAL SYSTEMS AND MODERN OPTOELECTRONIC INSTRUMENTS, 2017, 10616
  • [5] Novel method and system for 3D profile measurement based on projection moire with changing lights for phase shifting
    Li, Genqian
    Luo, Zijian
    Wang, Xueli
    Tan, Yushan
    Zhongguo Jixie Gongcheng/China Mechanical Engineering, 2002, 13 (08):
  • [6] 3D reconstruction based on photoelastic fringes
    Tao, Bo
    Liu, Yao
    Huang, Licheng
    Chen, Guanjun
    Chen, Baojia
    CONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE, 2022, 34 (01):
  • [7] Developing of 3D curved surface digital profile modeling system based on the VxD technology
    Xiao, ZY
    ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 2, 2005, : 134 - 138
  • [8] A simple calibration method for structured light-based 3D profile measurement
    Xu, Jing
    Douet, Jules
    Zhao, Jianguo
    Song, Libin
    Chen, Ken
    OPTICS AND LASER TECHNOLOGY, 2013, 48 : 187 - 193
  • [9] New 3D surface profile measurement based on the phase-shift interfering technology
    Liu, B
    Yang, L
    Fan, JY
    Zhang, J
    FLATNESS, ROUGHNESS, AND DISCRETE DEFECTS CHARACTERIZATION FOR COMPUTER DISKS, WAFERS, AND FLAT PANEL DISPLAYS II, 1998, 3275 : 15 - 18
  • [10] New 3D surface profile measurement based on phase-shift interfering technology
    Liu, B
    Zhang, J
    Qiang, XF
    PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 2, 2002, : 395 - 399