A NEW APPROACH TO JOHNSON NOISE THERMOMETRY BASED ON NOISE MEASUREMENTS ONLY

被引:1
|
作者
Scandurra, G. [1 ]
Ciofi, C. [1 ]
Gambadoro, A. [1 ]
机构
[1] Dip Fis Mat & Ingn Elettron, I-98166 Messina, Italy
来源
FLUCTUATION AND NOISE LETTERS | 2011年 / 10卷 / 02期
关键词
Johnson Noise Thermometry; cross correlation; current noise measurements;
D O I
10.1142/S0219477511000430
中图分类号
O1 [数学];
学科分类号
0701 ; 070101 ;
摘要
Johnson Noise Thermometry (JNT) can be regarded as a quite well established technique for the evaluation of the temperature. It relays on the accurate estimation of the voltage noise across a resistor, that acts as a sensor, and on the knowledge of the resistance of the sensor itself. In order to perform a temperature measurement, therefore, the resistance of the sensor has to be measured with a high accuracy multimeter and afterwards, the voltage noise across its ends has to be estimated in the assumption that the resistance does not change with time and is independent of frequency. In this paper we present a new approach for JNT that is based on a four channel cross correlation technique that allows, at least in principle, to estimate the temperature of a passive bipole from noise measurements only, as the power spectra of the current noise of the bipole and the real and imaginary part of its admittance can all be obtained from a proper elaboration of the acquired noise spectra. In particular, as the real part of the bipole admittance can be estimated as a function of the frequency, the limitation of resorting to purely resistive bipoles is also removed. Preliminary results demonstrating the effectiveness of the approach we propose are reported in this paper. The most important technical limitations that, at present, prevent the new approach to compete with the most advanced technique developed for the case of the conventional JNT are also discussed.
引用
收藏
页码:133 / 145
页数:13
相关论文
共 50 条
  • [31] Investigation of the imperfection effect of correlation on Johnson noise thermometry
    Zhang, J. T.
    Xue, S. Q.
    METROLOGIA, 2008, 45 (04) : 436 - 441
  • [32] REDUCED NONLINEARITIES IN THE NIST JOHNSON NOISE THERMOMETRY SYSTEM
    Qu, Jifeng
    Benz, S. P.
    Pollarolo, A.
    Rogalla, H.
    2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM, 2010, : 74 - +
  • [33] ABSOLUTE HIGH-TEMPERATURE JOHNSON NOISE THERMOMETRY
    PEPPER, MG
    BROWN, JB
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (01): : 31 - 34
  • [34] A practical approach to calculating magnetic Johnson noise for precision measurements
    Phan, N. S.
    Clayton, S. M.
    Kim, Y. J.
    Ito, T. M.
    JOURNAL OF APPLIED PHYSICS, 2024, 136 (12)
  • [35] Demonstration of Johnson noise thermometry with all-superconducting quantum voltage noise source
    Yamada, Takahiro
    Urano, Chiharu
    Maezawa, Masaaki
    APPLIED PHYSICS LETTERS, 2016, 108 (04)
  • [36] Improved electronic measurement of the Boltzmann constant by Johnson noise thermometry
    Qu, Jifeng
    Benz, Samuel P.
    Pollarolo, Alessio
    Rogalla, Horst
    Tew, Weston L.
    White, Rod
    Zhou, Kunli
    METROLOGIA, 2015, 52 (05) : S242 - S256
  • [37] Probing THz intersubband absorption using Johnson noise thermometry
    Yoo, Changyun
    Sherwin, Mark S.
    West, Kenneth W.
    Pfeiffer, Loren N.
    Kawamura, Jonathan H.
    Karasik, Boris S.
    NANOPHOTONICS, 2024, 13 (10) : 1711 - 1723
  • [38] An improved electronic determination of the Boltzmann constant by Johnson noise thermometry
    Qu, Jifeng
    Benz, Samuel P.
    Coakley, Kevin
    Rogalla, Horst
    Tew, Weston L.
    White, Rod
    Zhou, Kunli
    Zhou, Zhenyu
    METROLOGIA, 2017, 54 (04) : 549 - 558
  • [39] Development of high frequency and wide bandwidth Johnson noise thermometry
    Crossno, Jesse
    Liu, Xiaomeng
    Ohki, Thomas A.
    Kim, Philip
    Fong, Kin Chung
    APPLIED PHYSICS LETTERS, 2015, 106 (02)
  • [40] Development of a Four-channel System for Johnson Noise Thermometry
    Pollarolo, A.
    Qu, Jifeng
    Rogalla, H.
    Dresselhaus, P. D.
    Benz, S. P.
    2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM, 2010, : 490 - 491