Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison

The paper suggests two methods for selecting the test frequencies to be used in fault diagnosis of analog electronic circuits. The first novel method is based on a sensitivity analysis and extends what suggested by the authors in [1]. The second novel method is blind in the, sense that selection of the input frequencies to be used for diagnostic purposes does not require either a priori information about the nature of the circuit or testing design background. As such, it is particularly appealing in non-linear circuits where the designer experience is of little value. The effectiveness of the frequency selection methods are compared with the one presented in [1] not only in terms of performance but also computational complexity.