Soft x-ray spectroscopy of high pressure liquid

被引:7
|
作者
Qiao, Ruimin [1 ]
Xia, Yujian [1 ,2 ]
Feng, Xuefei [1 ]
Macdougall, James [3 ]
Pepper, John [1 ]
Armitage, Kevin [1 ]
Borsos, Jason [1 ]
Knauss, Kevin G. [4 ]
Lee, Namhey [4 ]
Allezy, Arnaud [5 ]
Gilbert, Benjamin [4 ]
MacDowell, Alastair A. [1 ]
Liu, Yi-Sheng [1 ]
Glans, Per-Anders [1 ]
Sun, Xuhui [2 ]
Chao, Weilun [3 ]
Guo, Jinghua [1 ]
机构
[1] Lawrence Berkeley Natl Lab, Adv Light Source, 1 Cyclotron Rd, Berkeley, CA 94720 USA
[2] Soochow Univ, Jiangsu Key Lab Carbon Based Funct Mat & Devices, Inst Funct Nano & Soft Mat FUNSOM, Joint Int Res Lab Carbon Based Funct Mat & Device, Suzhou 215123, Jiangsu, Peoples R China
[3] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
[4] Lawrence Berkeley Natl Lab, Energy Geosci Div, Berkeley, CA 94720 USA
[5] Lawrence Berkeley Natl Lab, Div Engn, Berkeley, CA 94720 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2018年 / 89卷 / 01期
关键词
ELECTRONIC-STRUCTURE; PHOTOELECTRON-SPECTROSCOPY; LINI0.5MN1.5O4; ELECTRODES; AQUEOUS-SOLUTIONS; EVOLUTION; CELL; CO2; BEAMLINE; STORAGE; EDGE;
D O I
10.1063/1.5008444
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We describe a new experimental technique that allows for soft x-ray spectroscopy studies (similar to 100-1000 eV) of high pressure liquid (similar to 100 bars). We achieve this through a liquid cell with a 100 nm-thick Si3N4 membrane window, which is sandwiched by two identical O-rings for vacuum sealing. The thin Si3N4 membrane allows soft x-rays to penetrate, while separating the high-pressure liquid under investigation from the vacuum required for soft x-ray transmission and detection. The burst pressure of the Si3N4 membrane increases with decreasing size and more specifically is inversely proportional to the side length of the square window. It also increases proportionally with the membrane thickness. Pressures > 60 bars could be achieved for 100 nm-thick square Si3N4 windows that are smaller than 65 mu m. However, above a certain pressure, the failure of the Si wafer becomes the limiting factor. The failure pressure of the Si wafer is sensitive to the wafer thickness. Moreover, the deformation of the Si3N4 membrane is quantified using vertical scanning interferometry. As an example of the performance of the high-pressure liquid cell optimized for total-fluorescence detected soft x-ray absorption spectroscopy (sXAS), the sXAS spectra at the Ca L edge (similar to 350 eV) of a CaCl2 aqueous solution are collected under different pressures up to 41 bars. Published by AIP Publishing.
引用
收藏
页数:7
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