Artificial tailoring of carbon nanotube and its electrical properties under high-resolution transmission electron microscope

被引:3
|
作者
Nishijima, Takuya
Ueki, Ryuichi
Miyazawa, Yosuke
Fujita, Jun-ichi [1 ]
机构
[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan
关键词
Carbon nanotube; Nanomanipulation; Plastic deformation; Resistivity; HR-TEM;
D O I
10.1016/j.mee.2011.02.038
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the details of an electron-beam-induced crystallization process of amorphous carbon. A high-resolution transmission electron microscope having a homemade nanomanipulator was used to observe defect repairing and the plastic deformation of a carbon nanotube caused by Joule heating. Electron irradiation at 200 keV combined with 10 mu A Joule heating at 2 V biasing voltage induced the crystallization of carbon nanocapsules from an amorphous carbon fibril. Further, a current exceeding 20 mu A caused defect repairing prior to plastic deformation in a multiwalled carbon nanotube. The outermost layer of the buckled multiwalled nanotube was repaired, but the buckled innermost layer retained its sharp angles as a result of plastic deformation. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2519 / 2523
页数:5
相关论文
共 50 条
  • [21] HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPE
    CREWE, AV
    SCIENTIFIC AMERICAN, 1971, 224 (04) : 26 - &
  • [22] HIGH-RESOLUTION ELECTRON-MICROSCOPE
    HONDA, T
    WATANABE, E
    HARADA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 66 - 67
  • [23] HIGH-RESOLUTION ELECTRON-MICROSCOPE
    不详
    MEASUREMENT AND CONTROL, 1979, 12 (08): : 324 - 324
  • [24] Atomic resolution of single-walled carbon nanotubes using a field emission high-resolution transmission electron microscope
    Natl Inst for Research in Inorganic, Materials, Ibaraki, Japan
    Carbon, 11 (1858-1860):
  • [25] Atomic resolution of single-walled carbon nanotubes using a field emission high-resolution transmission electron microscope
    Golberg, D
    Bando, Y
    Bourgeois, L
    Kurashima, K
    CARBON, 1999, 37 (11) : 1858 - 1860
  • [26] Nonideality in Arrayed Carbon Nanotube Field Effect Transistors Revealed by High-Resolution Transmission Electron Microscopy
    Wang, Bo
    Lu, Haozhe
    Ding, Sujuan
    Ze, Yumeng
    Liu, Yifan
    Zhang, Zixuan
    Yin, Huimin
    Gao, Bing
    Li, Yichen
    He, Liu
    Kou, Yuanhao
    Zhang, Zhiyong
    Jin, Chuanhong
    ACS NANO, 2024, 18 (33) : 22474 - 22483
  • [27] In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope
    Golberg, D
    Mitome, M
    Kurashima, K
    Zhi, CY
    Tang, CC
    Bando, Y
    Lourie, O
    APPLIED PHYSICS LETTERS, 2006, 88 (12)
  • [28] Formation of carbon onions with Pd clusters in a high-resolution electron microscope
    Oku, T
    Schmid, G
    Suganuma, K
    JOURNAL OF MATERIALS CHEMISTRY, 1998, 8 (09) : 2113 - 2117
  • [29] A HIGH-RESOLUTION EVAPORATED-CARBON REPLICA TECHNIQUE FOR THE ELECTRON MICROSCOPE
    BRADLEY, DE
    JOURNAL OF THE INSTITUTE OF METALS, 1954, 83 (01): : 35 - &
  • [30] HIGH-RESOLUTION ELECTRON-MICROSCOPE OBSERVATION OF CARBON-FIBERS
    ENDO, M
    JOURNAL OF ELECTRON MICROSCOPY, 1984, 33 (01): : 80 - 80