Subwavelength resolution in far field microscopy without near field probe

被引：0
|
作者：
Xiao, MF [1 ]
Machorro, R [1 ]
机构：
[1] UNAM, CCMC, Ysidro, CA 92143 USA
来源：
OPTIK | 1998年 / 109卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present experimental results of far field microscopy on a silver him surface. Two contra-propagating surface plasmon polaritons art excited on the surface of the silver film. We have obtained images containing distinguish able subwavelength features on the surface.
引用
收藏
页码：177 / 180
页数：4
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