Physical Properties of Self-polarized PZT Thin Films at Compositions around the Morphotropic Phase Boundary

被引：1

作者：

Araujo, E. B. ^{[1
]}

Lima, E. C. ^{[2
]}

Bdikin, I. K. ^{[3
]}

Kholkin, A. L. ^{[4
]}

机构：

[1] Univ Estadual Paulista, Fac Engn, Dept Fis & Quim, BR-15385000 Ilha Solteira, SP, Brazil

[2] Univ Fed Tocantins, BR-77500000 Porto, Brazil

[3] Univ Aveiro, Dept Mech Engn & TEMA, P-3810193 Aveiro, Portugal

[4] Univ Aveiro, Dept Mat & Ceram Engn, CICECO, P-3810193 Aveiro, Portugal

来源：

ELECTROCERAMICS VI | 2014年 / 975卷

关键词：

PZT films; self-polarization; piezoelectric;

D O I：

10.4028/www.scientific.net/AMR.975.9

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The physical properties of self-polarized PbZr1-xTixO3 thin films with no preferential orientation in a range of compositions 0.46 <= x <= 0.50 were investigated. Structural analysis revealed the coexistence of monoclinic-tetragonal and monoclinic-rhombohedral phases at compositions 0.46 <= x <= 0.49, where the monoclinic phase was in the majority and both the tetragonal and the rhombohedral phases in the minority. The dielectric permittivity (epsilon' = 447) reached its maximum at around composition x = 0.48. Asymmetries in the macroscopic and local hysteresis loops confirmed the existence of the self-polarization effect in the studied films.

引用

页码：9 / +

页数：3

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