Shear-force atomic force microscope by using the second resonance regime of tuning fork probe

被引：0

作者：

Liu, Zhuang ^{[1
,2
]}

Zhang, Ying ^{[1
]}

Kok, Shaw Wei ^{[1
]}

Ng, Boon Ping ^{[1
]}

Soh, Yeng Chai ^{[2
]}

机构：

[1] Singapore Inst Mfg Technol, Singapore 638075, Singapore

[2] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 19期

关键词：

SCANNING OPTICAL MICROSCOPY;

D O I：

10.1063/1.3518057

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An imaging scheme of shear-force atomic force microscope is proposed by exploiting the second resonance regime of the tuning fork probe. Theoretical analysis and experimental results demonstrate that the imaging scheme can deliver better sensitivity and higher resolution of topographic imaging. (C) 2010 American Institute of Physics. [doi:10.1063/1.3518057]

引用

页数：3

共 50 条

[31] Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor
Hussain, Danish
Wen, Yongbing
Zhang, Hao
Song, Jianmin
Xie, Hui
SENSORS, 2018, 18 (01):
[32] Photo-thermal quartz tuning fork excitation for dynamic mode atomic force microscope
Bontempi, Alexia
Teyssieux, Damien
Friedt, Jean-Michel
Thiery, Laurent
Hermelin, Damien
Vairac, Pascal
APPLIED PHYSICS LETTERS, 2014, 105 (15)
[33] Force measurements of bacterial adhesion on metals using a cell probe atomic force microscope
Sheng, Xiaoxia
Ting, Yen Peng
Pehkonen, Simo Olavi
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2007, 310 (02) : 661 - 669
[34] Piezoelectric tuning fork probe for atomic force microscopy imaging and specific recognition force spectroscopy of an enzyme and its ligand
Makky, Ali
Viel, Pascal
Chen, Shu-wen Wendy
Berthelot, Thomas
Pellequer, Jean-Luc
Polesel-Maris, Jerome
JOURNAL OF MOLECULAR RECOGNITION, 2013, 26 (11) : 521 - 531
[35] Formation of Magnetic Nanostructures Using an Atomic Force Microscope Probe
A. G. Temiryazev
M. P. Temiryazeva
A. V. Zdoroveyshchev
O. V. Vikhrova
Yu. V. Nikulin
Yu. V. Khivintsev
S. A. Nikitov
Technical Physics, 2019, 64 : 1716 - 1721
[36] Formation of Magnetic Nanostructures Using an Atomic Force Microscope Probe
Temiryazev, A. G.
Temiryazeva, M. P.
Zdoroveyshchev, A., V
Vikhrova, O. V.
Nikulin, Yu, V
Khivintsev, Yu, V
Nikitov, S. A.
TECHNICAL PHYSICS, 2019, 64 (11) : 1716 - 1721
[37] Measuring Dielectrophoresis Force for Metallic and Non-metallic Particle Manipulations via a Quartz Tuning Fork Atomic Force Microscope
Sunghoon Hong
Chungman Kim
Hansol Song
Sangmin An
Hosang Yoon
Wonho Jhe
Journal of the Korean Physical Society, 2019, 75 : 1021 - 1027
[38] Measuring Dielectrophoresis Force for Metallic and Non-metallic Particle Manipulations via a Quartz Tuning Fork Atomic Force Microscope
Hong, Sunghoon
Kim, Chungman
Song, Hansol
An, Sangmin
Yoon, Hosang
Jhe, Wonho
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2019, 75 (12) : 1021 - 1027
[39] Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope
Sangmin An
Baekman Sung
Haneol Noh
Corey Stambaugh
Soyoung Kwon
Kunyoung Lee
Bongsu Kim
Qhwan Kim
Wonho Jhe
Nano-Micro Letters, 2014, (01) : 70 - 79
[40] Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope
An, Sangmin
Sung, Baekman
Noh, Haneol
Stambaugh, Corey
Kwon, Soyoung
Lee, Kunyoung
Kim, Bongsu
Kim, Qhwan
Jhe, Wonho
NANO-MICRO LETTERS, 2014, 6 (01) : 70 - 79

← 1 2 3 4 5 →