An inference method for temperature step-stress accelerated life testing

被引：1
|
作者：
Gouno, E [1 ]
机构：
[1] Univ Bretagne Sud, IUP de Tohannic, F-56000 Vannes, France
来源：
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | 2001年 / 17卷 / 01期
关键词：
accelerated life testing; step-stress; activation energy; failure rate; Arrhenius model;
D O I：
10.1002/qre.362.abs
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper deals with step-stress accelerated life testing. It presents a practical method to analyse temperature step-stress accelerated life test data. The Arrhenius model is considered. Activation energy and failure rate under operational conditions are estimated both graphically and using maximum likelihood. Applications on simulated data and on real data are presented. Copyright (C) 2001 John Wiley & Sons, Ltd.
引用
收藏
页码：11 / 18
页数：8
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